Prof. Dr.-Ing. Robert Weigel

Lehrstuhl für Technische Elektronik (LTE) Technische Fakultät

A 150-168 GHz Mixer and Quadrupler Unit in SiGe BiCMOS Technology for JCAS Applications Based on DDS Signal Generation Up to 5 GHz (2025) Isbilen T, Breun S, Arneth N, Schrotz AM, Scheller K, Franchi N, Weigel R Conference contribution, Conference Contribution Proposing a Joint Communication and Sensing Approach using Code Spread Spectrum Techniques (2025) Faghih-Naini S, Peters S, Fischer G, Weigel R, Reißland T Conference contribution, Conference Contribution A Fully Substrate Integrated Moebius Loop Antenna System for EMP Measurements (2025) Pfannenmüller C, Kurin T, Schreiner S, Weigel R, Fischer G, Lurz F Conference contribution Drain Voltage Impact on a Doherty Power Amplifier's Optimal Splitting Parameters (2025) Illmer A, Deublein A, Loose M, Musolff C, Weigel R, Fischer G Conference contribution, Conference Contribution A Broadband Sub-THz Push-Push Frequency Doubler in 22 nm FDSOI (2025) Scheller K, Engelmann A, Hetterle P, Weigel R, Schrotz AM, Fischer G Conference contribution, Conference Contribution A J- and D-Band Dual-Band Receiver for FMCW Radar and RadCom in a SiGe Technology (2025) Schrotz AM, Breun S, Fischer G, Weigel R Conference contribution, Conference Contribution Integrated Time Domain Multiplexer for Superconducting Qubit Control at Millikelvin Temperatures (2025) Schöpplein V, Breun S, Löffler J, Koch M, Loose M, Dietz M, Carlowitz C, et al. Conference contribution, Conference Contribution A DC to 17 GHz Area-Efficient VGA with 20 DB Linear DB Tuning Range in 22 nm FDSOI (2025) Scheller K, Engelmann A, Hetterle P, Löffler J, Weigel R, Schrotz AM, Franchi N Conference contribution, Conference Contribution RF Switches in CMOS FDSOI Process—from Circuit Concepts to Implementation (2025) Özdamar O, Solomko V, Syroiezhin S, Weigel R Authored book Partikelexposition bei metallbearbeitenden Prozessen – Beurteilung des Arbeitsschutzes durch Sensornetzwerk und Modellierung (2025) Hochreiter C, Matheis C, Buschhaus M, Li R, Wenninger F, Klan S, Weigel R Journal article