Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB)

Research facility


Location: Erlangen, Germany (DE) DE

ISNI: 0000000104810543

ROR: https://ror.org/04q5rka56

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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

From
To

Abstract

Journal

Analytical Modelling of the Quasi-Static Operation of a Monolithically Integrated 4H-SiC Circuit Breaker Device (2024) Boettcher N, Rommel M, Erlbacher T Journal article Simulation-Guided Analysis towards Trench Depth Optimization for Enhanced Flexibility in Stretch-Free, Shape-Induced Interconnects for Flexible Electronics (2024) Joch D, Lang T, Sanctis S, Jank M Journal article AI for Stability Optimization in Low Voltage Direct Current Microgrids (2024) Roeder G, Schwanninger R, Wienzek P, Kerscher M, Wunder B, Schellenberger M Book chapter / Article in edited volumes Operating strategies for a Regional Airport to challenge future hybrid-electric aircraft systems (2024) Meindl M, Krödel PO, Lange C, März M Conference contribution, Original article Velocity-Based Channel Charting with Spatial Distribution Map Matching (2024) Stahlke M, George Y, Feigl T, Eskofier B, Mutschler C Journal article Adhesion strength of ductile thin film determined by cross-sectional nanoindentation (2024) Zhao D, Letz S, Jank M, März M Journal article Increasing 4H-SiC Trench Depth by Improving the Dry Etch Selectivity towards the Oxide Hard Mask (2024) Rusch O, Brueckner K, Erlbacher T Book chapter / Article in edited volumes A 4H-SiC CMOS Technology enabling Smart Sensor Integration and Circuit Operation above 500 °C (2024) May A, Rommel M, Baier L, Schraml M, Dick J, Jank M, Schulze J Conference contribution Imaging effects of particles on the surface of EUV mask and wafer (2024) Semaan R, Bottiglieri G, Erdmann A, Rispens G, de Winter L, Beekmans S Conference contribution Epitaxy of >7 μm Thick GaN Drift Layers on 150 mm Si(111) Substrates Realizing Vertical PN Diodes with 1200 V Breakdown Voltage (2024) Michler S, Hamdaoui Y, Thapa S, Schwalb G, Besendörfer S, Ziouche K, Albrecht M, et al. Journal article