Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB)

Research facility


Location: Erlangen, Germany (DE) DE

ISNI: 0000000104810543

ROR: https://ror.org/04q5rka56

Show on Map:

close-button

Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

From
To

Abstract

Journal

Current voltage characteristics through grains and grain boundaries of high-k dielectric thin films measured by tunneling atomic force microscopy (2011) Murakami K, Rommel M, Yanev V, Bauer A, Frey L Conference contribution, Conference Contribution A novel PWM control for a bi-directional full-bridge DC-DC converter with smooth conversion mode transitions (2011) Lorentz VRH, Schwarzmann H, März M, Bauer AJ, Ryssel H, Frey L, Poure P, Braun F Journal article, Original article A highly sensitive evaluation method for the determination of different current conduction mechanisms through dielectric layers (2011) Murakami K, Rommel M, Yanev V, Erlbacher T, Bauer AJ, Frey L Journal article, Original article Tuning of charge carrier density of ZnO nanoparticle films by oxygen plasma treatment (2011) Walther S, Polster S, Jank MPM, Thiem H, Ryssel H, Frey L Journal article, Original article Germanium substrate loss during thermal processing (2011) Kaiser RJ, Koffel S, Pichler P, Bauer AJ, Amon B, Frey L, Ryssel H Journal article, Original article Experiments and simulation of the diffusion and activation of the n-type dopants P, As, and Sb implanted into germanium (2011) Koffel S, Kaiser RJ, Bauer AJ, Amon B, Pichler P, Lorenz J, Frey L, et al. Journal article, Original article Enhancement of the stability of Ti and Ni ohmic contacts to 4H-SiC with a stable protective coating for harsh environment applications (2011) Daves W, Krauss A, Haeublein V, Bauer AJ, Frey L Journal article, Original article Implication of oxygen vacancies on current conduction mechanisms in TiN/Zr1-xAlxO2/TiN metal-insulator-metal structures (2011) Paskaleva A, Lemberger M, Bauer AJ, Frey L Journal article, Original article Gate oxide reliability at the nanoscale evaluated by combining conductive atomic force microscopy and constant voltage stress (2011) Erlbacher T, Yanev VC, Rommel M, Bauer A, Frey L Journal article Properties of SiO2 and Si3 N4 as gate dielectrics for printed ZnO transistors (2011) Walther S, Polster S, Meyer B, Jank MPM, Ryssel H, Frey L Journal article, Original article
‹ 1 ... 40 41 42 43 44 ... 50 ›