Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB)

Research facility


Location: Erlangen, Germany (DE) DE

ISNI: 0000000104810543

ROR: https://ror.org/04q5rka56

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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

From
To

Abstract

Journal

Evaluation of Semiconductor-Based Isolation for Electric Vehicle Chargers in DC Microgrids (2024) Drexler K, Gehring J, Wunder B, Zhou Y, März M, Lorentz VRH Conference contribution, Original article Analytical Modelling of the Quasi-Static Operation of a Monolithically Integrated 4H-SiC Circuit Breaker Device (2024) Boettcher N, Rommel M, Erlbacher T Journal article Simulation-Guided Analysis towards Trench Depth Optimization for Enhanced Flexibility in Stretch-Free, Shape-Induced Interconnects for Flexible Electronics (2024) Joch D, Lang T, Sanctis S, Jank MP Journal article AI for Stability Optimization in Low Voltage Direct Current Microgrids (2024) Roeder G, Schwanninger R, Wienzek P, Kerscher M, Wunder B, Schellenberger M Book chapter / Article in edited volumes Operating strategies for a Regional Airport to challenge future hybrid-electric aircraft systems (2024) Meindl M, Krödel PO, Lange C, März M Conference contribution, Original article Velocity-Based Channel Charting with Spatial Distribution Map Matching (2024) Stahlke M, George Y, Feigl T, Eskofier B, Mutschler C Journal article Adhesion strength of ductile thin film determined by cross-sectional nanoindentation (2024) Zhao D, Letz S, Jank M, März M Journal article Increasing 4H-SiC Trench Depth by Improving the Dry Etch Selectivity towards the Oxide Hard Mask (2024) Rusch O, Brueckner K, Erlbacher T Book chapter / Article in edited volumes A 4H-SiC CMOS Technology enabling Smart Sensor Integration and Circuit Operation above 500 °C (2024) May A, Rommel M, Baier L, Schraml M, Dick J, Jank M, Schulze J Conference contribution Imaging effects of particles on the surface of EUV mask and wafer (2024) Semaan R, Bottiglieri G, Erdmann A, Rispens G, de Winter L, Beekmans S Conference contribution