Netherlands Institute for Space Research / Stichting Ruimteonderzoek Nederland (SRON)

Research facility


Location: Utrecht, Netherlands (NL) NL

ISNI: 0000000406462222

ROR: https://ror.org/02wc0kq10

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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

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To

Abstract

Journal

Time-Domain Modeling of TES Microcalorimeters Under AC Bias (2020) Kirsch C, Gottardi L, Lorenz M, Dauser T, den Hartog R, Jackson B, Peille P, et al. Journal article Quantifying the Effect of Cosmic Ray Showers on the X-IFU Energy Resolution (2020) Peille P, Den Hartog R, Miniussi A, Stever S, Bandler S, Kirsch C, Lorenz M, et al. Journal article Accretion in strong field gravity with eXTP (2019) De Rosa A, Uttley P, Gou L, Liu Y, Bambi C, Barret D, Belloni T, et al. Journal article, Review article Observatory science with eXTP (2019) In'T Zand JJM, Bozzo E, Qu J, Li XD, Amati L, Chen Y, Donnarumma I, et al. Journal article The enhanced X-ray Timing and Polarimetry mission-eXTP (2019) Zhang S, Santangelo A, Feroci M, Xu Y, Lu F, Chen Y, Feng H, et al. Journal article, Review article Arcus: The Soft X-ray Grating Explorer (2019) Smith RK, Abraham M, Baird G, Bautz M, Bookbinder J, Bregman J, Brenneman L, et al. Conference contribution The Performance of the Athena X-ray Integral Field Unit at Very High Count Rates (2018) Peille P, Dauser T, Kirsch C, Den Hartog R, Cucchetti E, Wilms J, Barret D, et al. Journal article The Athena X-ray Integral Field Unit (X-IFU) (2018) Pajot F, Barret D, Lam-Trong T, Den Herder JW, Piro L, Cappi M, Huovelin J, et al. Journal article Crosstalk in an FDM Laboratory Setup and the Athena X-IFU End-to-End Simulator (2018) Den Hartog R, Kirsch C, De Vries C, Akamatsu H, Dauser T, Peille P, Cucchetti E, et al. Conference contribution Tracking of an electron beam through the solar corona with LOFAR (2018) Mann G, Breitling F, Vocks C, Aurass H, Steinmetz M, Strassmeier KG, Bisi MM, et al. Journal article
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