GE Global Research
Industry / private company
Location:
Niskayuna,
United States (USA) (US)
ISNI: 0000000406188884
ROR: https://ror.org/03e06qt98
Show on Map:
Planar defect formation in the gamma' phase during high temperature creep in single crystal CoNi-base superalloys (2016)
Eggeler Y, Müller J, Titus MS, Suzuki A, Pollock TM, Spiecker E
Journal article
Joint Super-Resolution Using Only One Anisotropic Low-Resolution Image per q-Space Coordinate (2014)
Golkov V, Sperl JI, Menzel MI, Sprenger T, Tan ET, Marinelli L, Hardy CJ, et al.
Conference contribution