Siemens AG

Industry / private company


Location: Nürnberg, München, Germany (DE) DE

ISNI: 000000012178835X

ROR: https://ror.org/059mq0909

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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

From
To

Abstract

Journal

Influence of Current Density on Wire Bond Lifetime in Active Power Cycling Test (2022) Sippel M, Schmidt R, Kaesbauer M, Sprenger M, Hensel A, Franke J Conference contribution Reproducibility in dual energy CT: the impact of a projection domain material decomposition method (2022) Haase V, Noo F, Stierstorfer K, Maier A, McNitt-Gray M Conference contribution Implementation of closed-loop Adaptive Power Control for VSC-HVDC in a Power System Control Center Demonstrator (2022) Raab A, Sennewald T, Wiest P, Schlegel S, Heyde C, Mehlmann G, Krebs R, et al. Conference contribution Machine Learning-based Detection of Spherical Markers in CT Volumes (2022) Rao D, Maass N, Dennerlein F, Maier A, Huang Y Conference contribution Performance of synchronizing units under reduced system strength (2021) Kuri A, Höse R, Mehlmann G, Zurowski R, Audring D, Luther M Conference contribution, Original article Deep action learning enables robust 3D segmentation of body organs in various CT and MRI images (2021) Zhong X, Amrehn M, Ravikumar N, Chen S, Strobel N, Birkhold A, Kowarschik M, et al. Journal article The Role of Physical Activity-Related Health Competence and Leisure-Time Physical Activity for Physical Health and Metabolic Syndrome: A Structural Equation Modeling Approach for German Office Workers (2021) Blaschke S, Carl J, Ellinger J, Birner U, Mess F Journal article, Original article Failure and Risk Analysis based on Maintenance Reports of Machines Components in Manufacturing Industry (2021) Thamm A, Herz M, Wiedemann M, Thamm F, Maier A Conference contribution, Conference Contribution An Automated Optical Inspection System for PIP Solder Joint Classification Using Convolutional Neural Networks (2021) Schmidt K, Rauchensteiner D, Voigt C, Thielen N, Bönig J, Beitinger G, Franke J Conference contribution, Conference Contribution Transient active power control of HVDC links through impedance-based voltage angle comparison (2021) Riebesel D, Raab A, Porst J, Luther M, Heyde C, Krebs R Conference contribution, Conference Contribution