Lehrstuhl für Elektronische Bauelemente

Experiments and simulation of the diffusion and activation of the n-type dopants P, As, and Sb implanted into germanium (2011) Koffel S, Kaiser RJ, Bauer AJ, Amon B, Pichler P, Lorenz J, Frey L, et al. Journal article, Original article Enhancement of the stability of Ti and Ni ohmic contacts to 4H-SiC with a stable protective coating for harsh environment applications (2011) Daves W, Krauss A, Haeublein V, Bauer AJ, Frey L Journal article, Original article Conduction Mechanisms and Environmental Sensitivity of Solution-Processed Silicon Nanoparticle Layers for Thin-Film Transistors (2011) Weis S, Körmer R, Jank M, Lemberger M, Otto M, Ryssel H, Peukert W, Frey L Journal article Implication of oxygen vacancies on current conduction mechanisms in TiN/Zr1-xAlxO2/TiN metal-insulator-metal structures (2011) Paskaleva A, Lemberger M, Bauer AJ, Frey L Journal article, Original article Analysis of the effect of germanium preamorphization on interface defects and leakage current for high-k metal-oxide-semiconductor field-effect transistor (2011) Roll G, Jakschik S, Goldbach M, Wachowiak A, Mikolajick T, Frey L Journal article, Original article Ferroelectricity in yttrium-doped hafnium oxide (2011) Müller J, Schröder UP, Böschke TS, Müller I, Böttger U, Wilde L, Sundqvist J, et al. Journal article, other Gate oxide reliability at the nanoscale evaluated by combining conductive atomic force microscopy and constant voltage stress (2011) Erlbacher T, Yanev VC, Rommel M, Bauer A, Frey L Journal article Dopant profiles in silicon created by MeV hydrogen implantation: Influence of annealing parameters (2011) Laven J, Hans Joachim S, Häublein V, Niedernostheide FJ, Ryssel H, Frey L Journal article Properties of SiO2 and Si3 N4 as gate dielectrics for printed ZnO transistors (2011) Walther S, Polster S, Meyer B, Jank MPM, Ryssel H, Frey L Journal article, Original article Manufacturing, characterization, and application of nanoimprinted metallic probe demonstrators for electrical scanning probe microscopy (2011) Jambreck JD, Yanev V, Schmitt H, Rommel M, Bauer AJ, Frey L Journal article, Original article