Lehrstuhl für Elektronische Bauelemente


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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

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Abstract

Journal

Silicon nitride, a high potential dielectric for 600 v integrated RC-snubber applications (2015) Krach F, Schwarzmann H, Bauer A, Erlbacher T, Frey L Journal article, Original article Charge pumping measurements on differently passivated lateral 4H-SiC MOSFETs (2015) Salinaro A, Pobegen G, Aichinger T, Zippelius B, Peters DP, Friedrichs P, Frey L Journal article, Original article Bragg gratings in imprinted Ormocer® waveguides (2015) Girschikofsky MG, Förthner M, Rommel M, Frey L, Hellmann R Conference contribution, Conference Contribution Tailoring the Electrical Properties of HfO2 MOS-Devices by Aluminum Doping (2015) Paskaleva A, Rommel M, Hutzler A, Spassov D, Bauer A Journal article, Original article SiC MOSFETs in hard-switching bidirectional DC/DC converters (2015) Heckel T, Eckhardt B, März M, Frey L, Heckel T Authored book, Volume of book series Influence of annealing, oxidation and doping on conduction-band near interface traps in 4H-SiC characterized by low temperature conductance measurements (2015) Noll S, Rambach M, Grieb M, Scholten D, Bauer A, Frey L Authored book, Volume of book series Modeling of ion drift in 4H-SiC-based chemical MOSFET sensors (2015) Erlbacher T, Schwarzmann H, Bauer AJ, Doehler GH, Schreivogel M, Lutz T, Guillen FH, et al. Journal article Calculating phase currents for high frequency three phase inductors via the inductance matrix (2015) Stolzke T, Stadler A, Gulden C Conference contribution, Conference Contribution Printing of Ultrathin Nanoparticulate Indium Tin Oxide Structures (2015) Wegener CM, Spiehl D, Mikschl F, Liu X, Roosen A Conference contribution, Conference Contribution Comparison of silicon and 4H silicon carbide patterning using focused ion beams (2015) Kaliya Perumal Veerapandian S, Beuer S, Rumler M, Stumpf F, Thomas K, Pillatsch L, Michler J, et al. Journal article