Thin Solid Films
Journal Abbreviation: THIN SOLID FILMS
ISSN: 0040-6090
Publisher: Elsevier
Publications (85)
Deriving the kinetic parameters for Pt-silicide formation from temperature ramped in situ ellipsometric measurements (2000)
Hundhausen M, Ley L
Journal article
Optical and structural characterization of Si/SiGe heterostructures grown by RTCVD (2000)
Ferrari M, Strunk HP, Christiansen S, Sidiki T, Chabert S, de Boer W, Sotomayor T
Journal article
Surface structure characterization by photoelectron holography (1996)
Zharnikov M, Weinelt M, Zebisch P, Steinrück HP
Journal article, Original article
Langmuir-Blodgett films of 1-t-butyl-9-hydrofullerene-60 (1993)
Williams G, Soi A, Hirsch A, Bryce MR, Petty MC
Journal article, Original article
Modification of Surface Films on Metallic Substrates by Excimer Laser Irradiation (1989)
Bergmann HW, Schubert E, Schmatjko KJ, Dembowski J
Journal article
