Evaluation of Semiconductor-Based Isolation for Electric Vehicle Chargers in DC Microgrids

Drexler K, Gehring J, Wunder B, Zhou Y, März M, Lorentz VRH (2024)


Publication Language: English

Publication Type: Conference contribution, Original article

Publication year: 2024

Publisher: IEEE

City/Town: New York City

Pages Range: 1-6

Conference Proceedings Title: 2024 IEEE Sixth International Conference on DC Microgrids (ICDCM)

Event location: Columbia, SC US

DOI: 10.1109/ICDCM60322.2024.10664861

Abstract

In this paper, converters with semiconductor-based isolation for the application of electric vehicle (EV) charging in DC-microgrids are introduced. A PLECS circuit simulation model is set up to examine the fault behavior of those converters in comparison to standard isolated and non-isolated topologies. Three different fault scenarios are evaluated and influence of the converter topology on the system behavior is examined. It is shown that the semiconductor-based isolating converter has a similar behavior to the standard isolating converter considering systemic faults.

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How to cite

APA:

Drexler, K., Gehring, J., Wunder, B., Zhou, Y., März, M., & Lorentz, V.R.H. (2024). Evaluation of Semiconductor-Based Isolation for Electric Vehicle Chargers in DC Microgrids. In 2024 IEEE Sixth International Conference on DC Microgrids (ICDCM) (pp. 1-6). Columbia, SC, US: New York City: IEEE.

MLA:

Drexler, Kilian, et al. "Evaluation of Semiconductor-Based Isolation for Electric Vehicle Chargers in DC Microgrids." Proceedings of the IEEE International Conference on DC Microgrids (ICDCM 2024), Columbia, SC New York City: IEEE, 2024. 1-6.

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