Close up on crystal plasticity
Mughrabi H, Ungár T (2006)
Publication Language: English
Publication Type: Journal article, Review article
Publication year: 2006
Journal
Book Volume: 5
Pages Range: 601-602
Journal Issue: 8
DOI: 10.1038/nmat1706
Abstract
A technique of X-ray diffraction was applied to investigate deformation-induced dislocation microstructures with submicrometer resolution. X-ray microscopy allows measurements of residual long-range internal stresses in deformed single crystals of copper with a spatial resolution of a few hundred nanometers. X-ray diffraction shows that long-range internal back-stresses prevailed in the cell interiors of their specimens that had been deformed in tension or in compression. The magnitude of the internal back-stresses varied from one cell interior to the next and shows that fluctuations are an inherent feature in deformed microstructures. The average diffraction profiles, obtained from large volumes of small crystal, exhibit characteristic asymmetrically broadened line profiles. The techniques provided advanced microstructural analysis of deformed crystalline materials.
Authors with CRIS profile
Additional Organisation(s)
Involved external institutions
Hungary (HU)How to cite
APA:
Mughrabi, H., & Ungár, T. (2006). Close up on crystal plasticity. Nature Materials, 5(8), 601-602. https://doi.org/10.1038/nmat1706
MLA:
Mughrabi, Hael, and Tamas Ungár. "Close up on crystal plasticity." Nature Materials 5.8 (2006): 601-602.
BibTeX: Download