Teubner J, Buerhop C, Pickel T, Hauch J, Camus C, Brabec C (2019)
Publication Language: English
Publication Type: Journal article
Publication year: 2019
Book Volume: 27
Journal Issue: 10
DOI: 10.1002/pip.3175
Reliability and quality control of photovoltaic (PV) plants increases in importance as the relevance of PV for the worldwide renewable energy production grows. In this study, a new method is presented which allows for a quantitative assessment of silicon PV module performance solely by relying on the cell temperatures measured via thermography (IR). A module temperature and power key figure are formulated and found to correlate very well with a linear relationship. The dependence of the deduced correlation's precision on measurement conditions is calculated and discussed. It facilitates decision-making because optimal measurement conditions usually occur only very rarely, such that a compromise between data quality and measurement frequency has to be found. The power loss correlation presented in this paper may be used as part of a maintenance routine in order to ensure the best possible long-term performance of the PV plant over its lifetime. The practical application in the field is outlined and explained.
APA:
Teubner, J., Buerhop, C., Pickel, T., Hauch, J., Camus, C., & Brabec, C. (2019). Quantitative assessment of the power loss of silicon PV modules by IR thermography and its dependence on data-filtering criteria. Progress in Photovoltaics, 27(10). https://doi.org/10.1002/pip.3175
MLA:
Teubner, Janine, et al. "Quantitative assessment of the power loss of silicon PV modules by IR thermography and its dependence on data-filtering criteria." Progress in Photovoltaics 27.10 (2019).
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