Ruff T, Hahn R, Killian MS, Asoh H, Ono S, Schmuki P (2012)
Publication Type: Journal article
Publication year: 2012
Book Volume: 62
Pages Range: 402-407
DOI: 10.1016/j.electacta.2011.12.045
Niobium oxide films with a thickness of approximately 165~nm were prepared by electrochemical anodization. These anodic oxide layers were then treated in an ammonia atmosphere at different temperatures and durations, and characterized with XRD, XPS, ToF-SIMS and photoelectrochemical methods. Under optimized conditions nitrogen doping of the niobium oxide films takes place, resulting in a distinct photo response in the visible range of light.
APA:
Ruff, T., Hahn, R., Killian, M.S., Asoh, H., Ono, S., & Schmuki, P. (2012). Visible light photo response from N-doped anodic niobium oxide after annealing in ammonia atmosphere. Electrochimica Acta, 62, 402-407. https://doi.org/10.1016/j.electacta.2011.12.045
MLA:
Ruff, T., et al. "Visible light photo response from N-doped anodic niobium oxide after annealing in ammonia atmosphere." Electrochimica Acta 62 (2012): 402-407.
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