Online monitoring of PVT SiC bulk crystal growth using digital x-ray imaging

Wellmann P, Bickermann M, Grau M, Hofmann HD, Straubinger T, Winnacker A (1999)

Publication Status: Published

Publication Type: Journal article, Original article

Publication year: 1999

Journal

Materials Research Society Symposium - Proceedings Materials Research Society

Book Volume: 572

Pages Range: 259-264

DOI: 10.1557/PROC-572-259

Abstract

An advanced method based on x-ray imaging is presented which allows us to visualize the ongoing processes during physical vapor transport (PVT) growth of SiC. Using a high resolution and high speed x-ray imaging detector based on image plates and digital recording we are able to follow the SiC bulk single crystal growth as well as the evolution of the SiC powder source inside the inductively heated graphite crucible on-line and quasi-continuously.

Authors with CRIS profile

Peter Wellmann Professur für Werkstoffwissenschaften (Werkstoffe der Elektrotechnik) Matthias Bickermann Technische Fakultät Albrecht Winnacker Technische Fakultät

How to cite

APA:

Wellmann, P., Bickermann, M., Grau, M., Hofmann, H.-D., Straubinger, T., & Winnacker, A. (1999). Online monitoring of PVT SiC bulk crystal growth using digital x-ray imaging. Materials Research Society Symposium - Proceedings, 572, 259-264. https://dx.doi.org/10.1557/PROC-572-259

MLA:

Wellmann, Peter, et al. "Online monitoring of PVT SiC bulk crystal growth using digital x-ray imaging." Materials Research Society Symposium - Proceedings 572 (1999): 259-264.

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