Contactless electrical defect characterization and topography of a-plane grown epitaxial layers

Wagner M, Mustafa E, Hahn S, Syväjärvi M, Yakimova R, Jang YS, Sakwe A, Wellmann P (2007)

Publication Status: Published

Publication Type: Journal article, Original article

Publication year: 2007

Journal

Materials Science Forum Trans Tech Publications

Book Volume: 556-557

Pages Range: 327-330

Event location: Newcastle upon Tyne

DOI: 10.4028/www.scientific.net/MSF.556-557.327

Authors with CRIS profile

Peter Wellmann Professur für Werkstoffwissenschaften (Werkstoffe der Elektrotechnik)

Involved external institutions

Technische Universität Bergakademie Freiberg DE Germany (DE) Linköping University SE Sweden (SE)

How to cite

APA:

Wagner, M., Mustafa, E., Hahn, S., Syväjärvi, M., Yakimova, R., Jang, Y.-S.,... Wellmann, P. (2007). Contactless electrical defect characterization and topography of a-plane grown epitaxial layers. Materials Science Forum, 556-557, 327-330. https://dx.doi.org/10.4028/www.scientific.net/MSF.556-557.327

MLA:

Wagner, M., et al. "Contactless electrical defect characterization and topography of a-plane grown epitaxial layers." Materials Science Forum 556-557 (2007): 327-330.

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