Vibrational resistance investigation of an IGBT gate driver utilizing Frequency Response Analysis (FRA) and Highly Accelerated Life Test (HALT)

Beitrag bei einer Tagung
(Konferenzbeitrag)


Details zur Publikation

Autor(en): März M, Schriefer T, Hofmann M
Herausgeber: VDE
Jahr der Veröffentlichung: 2018
ISBN: 978-3-8007-4540-1
Sprache: Englisch


Abstract

This work presents a methodology to determine the vibrational resistance
of electrical components in power electronic systems. The procedure is
exemplified by an IGBT gate driver that is mechano-dynamically characterized
applying Laser-Doppler-Vibrometry. The experimental reference is used to
validate a finite element model for predicting frequency response functions.
Knowing the stress configuration of the gate driver for different automotive
design spaces, statistical measures are applied to assess high cycle fatigue.
Based on the thesis of linear damage calculation, critical devices are
identified and time to failures calculated. As predicted lifetimes
significantly exceed reasonable laboratory times, a modified HALT test is
introduced that validates the lifetime model.


FAU-Autoren / FAU-Herausgeber

März, Martin Prof. Dr.
Lehrstuhl für Leistungselektronik


Autor(en) der externen Einrichtung(en)
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB)


Zitierweisen

APA:
März, M., Schriefer, T., & Hofmann, M. (2018). Vibrational resistance investigation of an IGBT gate driver utilizing Frequency Response Analysis (FRA) and Highly Accelerated Life Test (HALT). In VDE (Eds.), . Stuttgart, DE.

MLA:
März, Martin, Thomas Schriefer, and Maximilian Hofmann. "Vibrational resistance investigation of an IGBT gate driver utilizing Frequency Response Analysis (FRA) and Highly Accelerated Life Test (HALT)." Proceedings of the 2018 10th International Conference on Integrated Power Electronics Systems (CIPS), Stuttgart Ed. VDE, 2018.

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Zuletzt aktualisiert 2018-06-08 um 09:53