Filleter T, Maier S, Bennewitz R (2006)
Publication Status: Published
Publication Type: Journal article
Publication year: 2006
Publisher: AMERICAN PHYSICAL SOC
Book Volume: 73
Journal Issue: 15
DOI: 10.1103/PhysRevB.73.155433
Atomic-scale plastic deformation on a KBr(100) surface has been produced and characterized by use of atomic force microscopy (AFM) in ultrahigh vacuum. The structure of displaced material was imaged using noncontact mode AFM after first implementing the sharp silicon tip as an indenter. After indentation the KBr(100) surface is found to exhibit monatomic terraces which are formed via dislocation nucleation and glide. Discontinuities in the force-distance curves recorded during indentation are correlated to the creation of dislocation loops in the crystal. Incipient dislocation nucleation has been characterized as the abrupt monatomic layer displacement of the tip into the sample and the corresponding creation of monatomic terraces. The indenter radius has been found to significantly influence the lateral extent of the dislocation structure and the distribution of force discontinuities during indentation. The shear stress at the yield point was experimentally determined to be 2.5 GPa which is consistent with recent theoretical predictions for the ideal shear stress of KBr.
APA:
Filleter, T., Maier, S., & Bennewitz, R. (2006). Atomic-scale yield and dislocation nucleation in KBr. Physical Review B, 73(15). https://dx.doi.org/10.1103/PhysRevB.73.155433
MLA:
Filleter, Tobin, Sabine Maier, and Roland Bennewitz. "Atomic-scale yield and dislocation nucleation in KBr." Physical Review B 73.15 (2006).
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