Defect Structures in Neutron Irradiated 6H-SiC Studied by X-Ray Diffraction Line Profile Analysis

Magerl A, Hock R (2001)

Publication Type: Journal article

Publication year: 2001

Journal

Materials Research Society Symposium - Proceedings Materials Research Society

Publisher: Materials Research Society

Book Volume: 640

Pages Range: H6.4

Abstract

We have investigated by x-ray diffraction defect structures in 6H-SiC after neutron irradiation with different fluences and followed by different annealing procedures. An interpretation along a model of Klimanek [1,4-6] shows, that higher fluences lead to a stronger than linear reduction of the correlation length, whereas higher annealing temperatures correlate with a better recovery of the correlation length. In addition defects of 1st kind created by irradiation are reduced by annealing. We find that annealing changes the character of the defects and it accentuates a defect structure already present in the original samples.

Authors with CRIS profile

Andreas Magerl Lehrstuhl für Kristallographie und Strukturphysik Rainer Hock Professur für Kristallographie und Strukturphysik

How to cite

APA:

Magerl, A., & Hock, R. (2001). Defect Structures in Neutron Irradiated 6H-SiC Studied by X-Ray Diffraction Line Profile Analysis. Materials Research Society Symposium - Proceedings, 640, H6.4.

MLA:

Magerl, Andreas, and Rainer Hock. "Defect Structures in Neutron Irradiated 6H-SiC Studied by X-Ray Diffraction Line Profile Analysis." Materials Research Society Symposium - Proceedings 640 (2001): H6.4.

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