Defect Structures in Neutron Irradiated 6H-SiC Studied by X-Ray Diffraction Line Profile Analysis

Beitrag in einer Fachzeitschrift


Details zur Publikation

Autor(en): Magerl A, Hock R
Zeitschrift: Materials Research Society Symposium - Proceedings
Verlag: Materials Research Society
Jahr der Veröffentlichung: 2001
Band: 640
Seitenbereich: H6.4
ISSN: 0272-9172


Abstract


We have investigated by x-ray diffraction defect structures in 6H-SiC after neutron irradiation with different fluences and followed by different annealing procedures. An interpretation along a model of Klimanek [1,4-6] shows, that higher fluences lead to a stronger than linear reduction of the correlation length, whereas higher annealing temperatures correlate with a better recovery of the correlation length. In addition defects of 1st kind created by irradiation are reduced by annealing. We find that annealing changes the character of the defects and it accentuates a defect structure already present in the original samples.



FAU-Autoren / FAU-Herausgeber

Hock, Rainer Prof. Dr.
Professur für Kristallographie und Strukturphysik
Magerl, Andreas Prof. Dr.
Lehrstuhl für Kristallographie und Strukturphysik

Zuletzt aktualisiert 2018-09-08 um 06:09