Electrical properties of the hydrogen intercalated epitaxial graphene/SiC interface investigated by nanoscale current mapping

Giannazzo F, Hertel S, Albert A, Fisichella G, La Magna A, Roccaforte F, Krieger M, Weber HB (2015)


Publication Type: Journal article, Letter

Publication year: 2015

Journal

Publisher: Trans Tech Publications Ltd

Book Volume: 821-823

Pages Range: 929-932

ISBN: 9783038354789

DOI: 10.4028/www.scientific.net/MSF.821-823.929

Abstract

The electrical properties of the interface between quasi free standing bilayer graphene (QFBLG) and SiC(0001) have been investigated by nanoscale resolution current measurements using conductive atomic force microscopy (C-AFM). I-V analyses were carried out on Au-capped QFBLG contacts with different sizes (from 200 μm down to 0.5 m) fabricated on SiC samples with different miscut angles (from on-axis to 3.5° off-axis). The extracted QFBLG/SiC Schottky barrier height (SBH) was found to depend on the contact size. SBH values ~(0.9-1) eV were obtained for large contacts, whereas a gradual increase was observed below a critical (micrometer scale) contact size (depending on the SiC miscut angle) up to values approaching ~1.5 eV. Nanoscale resolution current mapping on bare QFLBG contacts revealed that SiC step edges and facets represent preferential current paths causing the effective SBH lowering for larger contacts. The reduced barrier height in these regions can be explained in terms of a reduced doping of QFBLG from SiC substrate at (11-20) step edges with respect to the p-type doping on the (0001) terraces.

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APA:

Giannazzo, F., Hertel, S., Albert, A., Fisichella, G., La Magna, A., Roccaforte, F.,... Weber, H.B. (2015). Electrical properties of the hydrogen intercalated epitaxial graphene/SiC interface investigated by nanoscale current mapping. Materials Science Forum, 821-823, 929-932. https://doi.org/10.4028/www.scientific.net/MSF.821-823.929

MLA:

Giannazzo, F., et al. "Electrical properties of the hydrogen intercalated epitaxial graphene/SiC interface investigated by nanoscale current mapping." Materials Science Forum 821-823 (2015): 929-932.

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