Extraordinary low transmission effects for ultra-thin patterned metal films

Reibold D, Shao F, Erdmann A, Peschel U (2009)

Publication Type: Journal article

Publication year: 2009

Journal

Optics Express Optical Society of America

Publisher: Optical Society of American (OSA)

Book Volume: 17

Pages Range: 544

Journal Issue: 17

DOI: 10.1364/OE.17.000544

Abstract

Thin metal films show a residual transmission for light in the visible and UV spectral range. This transmission can be strongly reduced by an appropriate sub-wavelength patterning of the metal film. Our investigation is focused on metal films with a thickness much below 100nm, where the transmission response is dominated by the individual posts acting like antennas and cannot be attributed to the excitation of surface plasmons. The almost complete suppression of transmission for ultra-thin metal films depends mainly on the absorber width, but not on the pitch of the pattern. The effect is robust with respect to imperfections of the geometry or larger features imprinted into the sub-wavelength pattern. © 2008 Optical Society of America.

Authors with CRIS profile

Ulf Peschel Professur für Experimentalphysik

Additional Organisation(s)

Erlangen Graduate School in Advanced Optical Technologies (SAOT) Exzellenz-Cluster Engineering of Advanced Materials (EAM)

Involved external institutions

Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB) DE Germany (DE)

How to cite

APA:

Reibold, D., Shao, F., Erdmann, A., & Peschel, U. (2009). Extraordinary low transmission effects for ultra-thin patterned metal films. Optics Express, 17(17), 544. https://doi.org/10.1364/OE.17.000544

MLA:

Reibold, David, et al. "Extraordinary low transmission effects for ultra-thin patterned metal films." Optics Express 17.17 (2009): 544.

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