Grauwet T, Rauh C, Van der Plancken I, Vervoort L, Hendrickx M, Delgado A, van Loey A (2012)
Publication Type: Journal article
Publication year: 2012
Publisher: Elsevier
Book Volume: 23
Pages Range: 97-110
Journal Issue: 2
DOI: 10.1016/j.tifs.2011.09.002
As pressure is assumed uniform and residence time is fixed, studying non-uniformity of high pressure process variables comes down to studying temperature uniformity. This review paper describes the progress made in developing two methods for temperature uniformity mapping within the EU FP6 integrated project: (i) computational thermal fluid dynamics (CTFD) modeling and simulation of temperature fields and (ii) use of pressure-temperature-time indicators (pTTIs) for experimental temperature uniformity mapping. In the first part of this contribution, the principle, potential and limitation of both procedures is outlined separately. In the second part, the outcome of the methods in the context of temperature uniformity illustration in different-scale high pressure reactors is exemplified and compared. Based on these examples, it is clear that the locations of low and high temperature zones depend on the pressure equipment used. Finally, screening literature data, some strategies are put forward to improve temperature uniformity under high pressure thermal processing conditions. © 2011 Elsevier Ltd.
APA:
Grauwet, T., Rauh, C., Van der Plancken, I., Vervoort, L., Hendrickx, M., Delgado, A., & van Loey, A. (2012). Potential and limitations of methods for temperature uniformity mapping in high pressure thermal processing. Trends in Food Science & Technology, 23(2), 97-110. https://doi.org/10.1016/j.tifs.2011.09.002
MLA:
Grauwet, Tara, et al. "Potential and limitations of methods for temperature uniformity mapping in high pressure thermal processing." Trends in Food Science & Technology 23.2 (2012): 97-110.
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