Electrical and optical characterization of p-type boron-doped 6H-SiC bulk crystals

Bickermann M, Weingärtner R, Herro ZG, Hofmann HD, Künecke U, Wellmann P, Winnacker A (2003)


Publication Language: English

Publication Status: Published

Publication Type: Journal article, Original article

Publication year: 2003

Journal

Publisher: Trans Tech Publications

City/Town: Switzerland

Book Volume: 433-436

Pages Range: 337-340

Conference Proceedings Title: Materials Science Forum (Volumes 433-436)

Event location: Linkoping SE

DOI: 10.4028/www.scientific.net/MSF.433-436.337

Abstract

Electrical and optical characterization was performed to obtain information about the doping and compensation levels of samples cut from boron doped, physical vapor transport (PVT) grown 6H-SiC crystals. Values for N-A and N-D can be derived from analysis on temperature dependent Hall effect measurement data. The charge carrier concentration p at room temperature depends approximately linearly on N-A/N-D. The below band-gap absorption (BBGA) maximum at about 730 nm is correlated mainly to N-A, and, for constant N-A, is slightly anti-correlated to N-D. The same results can be obtained from an rootalpha vs. E plot extrapolated to alpha = 0 in the near band-gap region, as the broad absorption band induces a shift in the optically detected band-gap towards lower energies. Absorption measurements can give an estimation of N-A-N-D in boron doped SiC samples, and from wafers cut from the same crystal, the concentration of boron and compensating impurities can be evaluated.

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How to cite

APA:

Bickermann, M., Weingärtner, R., Herro, Z.G., Hofmann, H.-D., Künecke, U., Wellmann, P., & Winnacker, A. (2003). Electrical and optical characterization of p-type boron-doped 6H-SiC bulk crystals. Materials Science Forum, 433-436, 337-340. https://dx.doi.org/10.4028/www.scientific.net/MSF.433-436.337

MLA:

Bickermann, Matthias, et al. "Electrical and optical characterization of p-type boron-doped 6H-SiC bulk crystals." Materials Science Forum 433-436 (2003): 337-340.

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