Development of a scanning electron microscopy with polarization analysis system for magnetic imaging with ns time resolution and phase-sensitive detection
Schoenke D, Oelsner A, Krautscheid P, Reeve RM, Klaeui M (2018)
Publication Type: Journal article
Publication year: 2018
Journal
Book Volume: 89
Article Number: 083703
Journal Issue: 8
DOI: 10.1063/1.5037528
Abstract
Scanning electron microscopy with polarization analysis is a powerful lab-based magnetic imaging technique offering simultaneous imaging of multiple magnetization components and a very high spatial resolution. However, one drawback of the technique is the long required acquisition time resulting from the low inherent efficiency of spin detection, which has limited the applicability of the technique to certain quasi-static measurement schemes and materials with high magnetic contrast. Here we demonstrate the ability to improve the signal-to-noise ratio for particular classes of measurements involving periodic excitation of the magnetic structure via the implementation of a digital phase-sensitive detection scheme facilitated by the integration of a time-to-digital converter to the system. The modified setup provides dynamic imaging capabilities using selected time windows and finally full time-resolved imaging with a demonstrated time resolution of better than 2 ns.
Involved external institutions
Germany (DE)How to cite
APA:
Schoenke, D., Oelsner, A., Krautscheid, P., Reeve, R.M., & Klaeui, M. (2018). Development of a scanning electron microscopy with polarization analysis system for magnetic imaging with ns time resolution and phase-sensitive detection. Review of Scientific Instruments, 89(8). https://doi.org/10.1063/1.5037528
MLA:
Schoenke, Daniel, et al. "Development of a scanning electron microscopy with polarization analysis system for magnetic imaging with ns time resolution and phase-sensitive detection." Review of Scientific Instruments 89.8 (2018).
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