X-ray-refractive-index measurements at photon energies above 100 keV with a grating interferometer

Ruiz-Yaniz M, Zanette I, Rack A, Weitkamp T, Meyer PE, Mohr J, Pfeiffer F (2015)

Publication Type: Journal article

Publication year: 2015

Journal

Physical Review A - Atomic, Molecular, and Optical Physics American Physical Society

Book Volume: 91

Article Number: 033803

Journal Issue: 3

DOI: 10.1103/PhysRevA.91.033803

Abstract

The knowledge of the x-ray index of refraction of materials is important for the interpretation or simulation of many x-ray physics phenomena. But its precise and accurate experimental determination is challenging, particularly in the hard x-ray energy range above 100 keV. In this article we present and discuss experimental measurements of the real and imaginary part of the index of refraction for different materials based on x-ray grating interferometry at energies above 130 keV.

Involved external institutions

European Synchrotron Radiation Facility (ESRF) FR France (FR) Technische Universität München (TUM) DE Germany (DE) Synchrotron SOLEIL FR France (FR) Karlsruhe Institute of Technology (KIT) DE Germany (DE)

How to cite

APA:

Ruiz-Yaniz, M., Zanette, I., Rack, A., Weitkamp, T., Meyer, P.E., Mohr, J., & Pfeiffer, F. (2015). X-ray-refractive-index measurements at photon energies above 100 keV with a grating interferometer. Physical Review A - Atomic, Molecular, and Optical Physics, 91(3). https://doi.org/10.1103/PhysRevA.91.033803

MLA:

Ruiz-Yaniz, M., et al. "X-ray-refractive-index measurements at photon energies above 100 keV with a grating interferometer." Physical Review A - Atomic, Molecular, and Optical Physics 91.3 (2015).

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