Defect recognition in crystalline silicon solar cells by X-ray tomosynthesis with layer resolution

Voland V, Hoyer U, Auer R, Salamon M, Uhlmann N, Brabec C (2015)

Publication Language: English

Publication Status: Published

Publication Type: Journal article, Original article

Publication year: 2015

Journal

Progress in Photovoltaics Wiley-Blackwell

Publisher: John Wiley and Sons Ltd

Book Volume: 23

Pages Range: 124-130

Journal Issue: 1

DOI: 10.1002/pip.2411

Abstract

The increasing demand for higher quality in solar cell production led to the development of several inline control methods. Beneath the image-guided methods, X-ray is not yet very well investigated for the application in photovoltaic research but shows high potential. In contrast to the ordinary X-ray radioscopic method, the tomosynthesis technique exhibits additional depth information of the solar cells and modules. In this article, several applications of tomosynthesis for the investigation of solar cells and modules are studied. It will be shown what potential the application of X-ray and especially tomosynthesis has as quality control tool for photovoltaics.

Authors with CRIS profile

Christoph Brabec Institute Materials for Electronics and Energy Technology (i-MEET)

Involved external institutions

Fraunhofer Development Center X-ray Technology (EZRT) DE Germany (DE) Bayerisches Zentrum für Angewandte Energieforschung e.V. (ZAE Bayern) DE Germany (DE)

How to cite

APA:

Voland, V., Hoyer, U., Auer, R., Salamon, M., Uhlmann, N., & Brabec, C. (2015). Defect recognition in crystalline silicon solar cells by X-ray tomosynthesis with layer resolution. Progress in Photovoltaics, 23(1), 124-130. https://doi.org/10.1002/pip.2411

MLA:

Voland, Virginia, et al. "Defect recognition in crystalline silicon solar cells by X-ray tomosynthesis with layer resolution." Progress in Photovoltaics 23.1 (2015): 124-130.

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