Current noise in single-molecule junctions induced by electronic-vibrational coupling

Journal article
(Letter)


Publication Details

Author(s): Schinabeck C, Härtle R, Weber HB, Thoss M
Journal: Physical Review B
Publisher: American Physical Society
Publication year: 2014
Volume: 90
Journal issue: 7
ISSN: 0163-1829


Abstract

The influence of multiple vibrational modes on current fluctuations in electron transport through single molecule junctions is investigated. Our analysis is based on a generic model of a molecular junction, which comprises a single electronic state on the molecular bridge coupled to multiple vibrational modes and fermionic leads, and employs a master equation approach. The results reveal that in molecular junctions with multiple vibrational modes, already weak to moderate electronic-vibrational coupling may result in high noise levels, especially at the onset of resonant transport, in accordance with the experimental findings of Secker et al. [Phys. Rev. Lett. 106, 136807 (2011)]. The underlying mechanisms are analyzed in some detail.


FAU Authors / FAU Editors

Härtle, Rainer
Interdisziplinäres Zentrum für Molekulare Materialien
Schinabeck, Christian
Professur für Theoretische Physik mit dem Schwerpunkt Elektronentransport in Molekülen
Thoss, Michael Prof. Dr.
Professur für Theoretische Physik mit dem Schwerpunkt Elektronentransport in Molekülen
Weber, Heiko B. Prof. Dr.
Lehrstuhl für Angewandte Physik


Additional Organisation
Exzellenz-Cluster Engineering of Advanced Materials


Research Fields

B Nanoelectronic Materials
Exzellenz-Cluster Engineering of Advanced Materials


How to cite

APA:
Schinabeck, C., Härtle, R., Weber, H.B., & Thoss, M. (2014). Current noise in single-molecule junctions induced by electronic-vibrational coupling. Physical Review B, 90(7). https://dx.doi.org/10.1103/PhysRevB.90.075409

MLA:
Schinabeck, Christian, et al. "Current noise in single-molecule junctions induced by electronic-vibrational coupling." Physical Review B 90.7 (2014).

BibTeX: 

Last updated on 2019-14-03 at 12:01