Measurement Uncertainties of Highly Reflective Low-Noise-Amplifiers for Magnetic Resonance Imaging
Schneider F, Pfannenmüller C, Jöstingmeier A, Ehses M, Simone G, Smith B, Maune H, Lurz F (2026)
Publication Language: English
Publication Type: Conference contribution, Conference Contribution
Publication year: 2026
Publisher: IEEE
Event location: Boston
URI: https://ieeexplore.ieee.org/document/11614628
DOI: 10.1109/ARFTG68740.2026.11614628
Abstract
The accurate characterization of the noise figure in preamplifiers used for magnetic resonance imaging is challenging due to their extremely low noise figures, high gain, and highly reflective input impedances. This work presents a comparative study of the Y-factor and cold-source measurement techniques on three representative low-noise amplifiers, 31-132 MHz, identifying the dominant sources of systematic uncertainty. The uncertainty calculations, derived from the two separate measurements, demonstrate a notable region of agreement, thereby substantiating the reliability of both methodologies. The analysis highlights the pivotal role of calibration standards and offers pragmatic guidelines to minimize the uncertainty budget.
Authors with CRIS profile
Christof Pfannenmüller
Lehrstuhl für Intelligente Technische Elektronik und Systeme
Gianluca Simone
Lehrstuhl für Intelligente Technische Elektronik und Systeme
Involved external institutions
Germany (DE)How to cite
APA:
Schneider, F., Pfannenmüller, C., Jöstingmeier, A., Ehses, M., Simone, G., Smith, B.,... Lurz, F. (2026). Measurement Uncertainties of Highly Reflective Low-Noise-Amplifiers for Magnetic Resonance Imaging. In Proceedings of the 2026 107th ARFTG Microwave Measurement Conference (ARFTG). Boston, US: IEEE.
MLA:
Schneider, Fabian, et al. "Measurement Uncertainties of Highly Reflective Low-Noise-Amplifiers for Magnetic Resonance Imaging." Proceedings of the 2026 107th ARFTG Microwave Measurement Conference (ARFTG), Boston IEEE, 2026.
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