Song Q, Le Corre VM, Heumüller T, Zhang H, Tang H, Peng Z, Bornschlegl A, Du X, Lüer L, Brabec C (2026)
Publication Type: Journal article
Publication year: 2026
DOI: 10.1039/d6el00116e
As organic photovoltaics (OPVs) achieve higher stability, traditional long-duration testing fails to provide timely feedback, impeding rapid optimization and commercialization. Degradation forecasting offers a solution, yet it remains fundamentally challenged by the complex, nonlinear degradation kinetics of OPV devices, which complicate forecasting. Here, we present a machine learning pipeline based on Class Symbolic Regression (CSR) that accurately extrapolates device degradation by an order of magnitude beyond the measured window, enabling day-scale stability decisions. Our workflow achieves 3–4% test error in quantitatively forecasting future degradation using the first 20 h for preliminary screening (200 h) and the first 100 h for long-term stability testing (1000 h). This approach, validated across >40 donor–acceptor systems and >100 processing conditions, demonstrates generalization across key stability metrics. Additionally, the workflow is lightweight, requiring few resources and training, making it suitable for various OPV laboratories, thereby compressing OPV stability-testing protocols from months to days. This work will accelerate decision-making and enhance the R&D process for the commercialization of OPV technology.
APA:
Song, Q., Le Corre, V.M., Heumüller, T., Zhang, H., Tang, H., Peng, Z.,... Brabec, C. (2026). Degradation forecasting for accelerated lifetime studies of organic photovoltaics via symbolic regression. EES Solar. https://doi.org/10.1039/d6el00116e
MLA:
Song, Qizhen, et al. "Degradation forecasting for accelerated lifetime studies of organic photovoltaics via symbolic regression." EES Solar (2026).
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