Partial Discharge Behavior of PET Films under High dV/dt Stress in Sphere-Plate Tests
Reißenweber L, Stadler A, Hahn I (2026)
Publication Type: Conference contribution
Publication year: 2026
Journal
Publisher: Institute of Electrical and Electronics Engineers Inc.
Book Volume: 2026-March
Pages Range: 997-1002
Conference Proceedings Title: Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
Event location: San Antonio, TX
ISBN: 9798331575441
DOI: 10.1109/APEC51134.2026.11516857
Abstract
The influence of high frequencies and high dV/dt on the partial discharge inception voltage (PDIV) and the lifetime under partial discharge stress of PET films (23-75μm) are investigated. The tests are carried out using a sphere-plate electrode arrangement with spheres of different diameters (3-7mm). The films are stressed at high frequencies (10-400kHz) using bipolar rectangular voltages generated by a SiC full bridge, with voltage slopes of ≈24V/ns and ≈44V/ns. Partial discharges are detected using a high-frequency current transformer and a high-pass filter with a cutoff frequency of 120MHz.
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Germany (DE)How to cite
APA:
Reißenweber, L., Stadler, A., & Hahn, I. (2026). Partial Discharge Behavior of PET Films under High dV/dt Stress in Sphere-Plate Tests. In Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC (pp. 997-1002). San Antonio, TX, US: Institute of Electrical and Electronics Engineers Inc..
MLA:
Reißenweber, Lukas, Alexander Stadler, and Ingo Hahn. "Partial Discharge Behavior of PET Films under High dV/dt Stress in Sphere-Plate Tests." Proceedings of the 41st Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2026, San Antonio, TX Institute of Electrical and Electronics Engineers Inc., 2026. 997-1002.
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