EmbeddedAD: Efficient Anomaly Detection on SoCs via Vector-Quantized Reverse Distillation

Deutel M, Marchl A, Plinge A, Hannig F, Teich J (2026)

Publication Language: English

Publication Type: Conference contribution, Conference Contribution

Publication year: 2026

Conference Proceedings Title: Proceedings of the 39th IEEE International System-on-Chip Conference (SOCC)

Event location: Heidelberg DE

Authors with CRIS profile

Mark Deutel Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design) Frank Hannig Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design) Jürgen Teich Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design)

Involved external institutions

Fraunhofer-Institut für Integrierte Schaltungen (IIS) DE Germany (DE)

How to cite

APA:

Deutel, M., Marchl, A., Plinge, A., Hannig, F., & Teich, J. (2026). EmbeddedAD: Efficient Anomaly Detection on SoCs via Vector-Quantized Reverse Distillation. In Proceedings of the 39th IEEE International System-on-Chip Conference (SOCC). Heidelberg, DE.

MLA:

Deutel, Mark, et al. "EmbeddedAD: Efficient Anomaly Detection on SoCs via Vector-Quantized Reverse Distillation." Proceedings of the 39th IEEE International System-on-Chip Conference (SOCC), Heidelberg 2026.

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