Transition-edge sensor characteristics in a modified bias circuit for multiplexed readout

Smith SJ, Van Der Hulst P, Wakeham NA, Cucchetti E, Doriese WB, Durkin M, Kirsch C, Ullom JN, Adams JS, Bandler SR, Chervenak JA, Farrahi T, Finkbeiner FM, Fuhrman JD, Hull SV, Kelley RL, Kilbourne CA, Muramatsu H, Porter FS, Sakai K, Venkatasubraman AC, Wassell EJ, Witthoeft MC, Yoon SH (2026)

Publication Type: Journal article

Publication year: 2026

Journal

IEEE Transactions on Applied Superconductivity Institute of Electrical and Electronics Engineers (IEEE)

DOI: 10.1109/TASC.2026.3664193

Abstract

The X-ray Integral Field Unit (X-IFU) on the NewAthena X-ray telescope will use a 1,504-pixel array of transition-edge sensor (TES) microcalorimeters, read out via time division multiplexing (TDM). To allow testing of multiplexer chips before TES integration, each unit cell includes a 'TES-bypass' resistor that substitutes for a TES during characterization. After integration, this resistor remains as a high-resistance shunt: minimal for DC operation but can influence the frequency response due to its placement with the Nyquist inductor. We modeled the modified bias circuit, derived the small-signal response, and evaluated noise contributions, including Johnson noise from the bypass resistor. We analyzed the effects on pulse height, slew-rate, and energy resolution. Simulations were compared with measurements from prototype X-IFU microcalorimeters. Our results indicate that as long as the resistor value exceeds the TES dynamic resistance, performance is largely unaffected.

Authors with CRIS profile

Christian Kirsch Lehrstuhl für Astronomie und Astrophysik

Involved external institutions

National Aeronautics and Space Administration (NASA) US United States (USA) (US) Netherlands Institute for Space Research / Stichting Ruimteonderzoek Nederland (SRON) NL Netherlands (NL) National Centre for Space Studies / Centre national d'études spatiales (CNES) FR France (FR) National Institute of Standards and Technology (NIST) US United States (USA) (US)

How to cite

APA:

Smith, S.J., Van Der Hulst, P., Wakeham, N.A., Cucchetti, E., Doriese, W.B., Durkin, M.,... Yoon, S.H. (2026). Transition-edge sensor characteristics in a modified bias circuit for multiplexed readout. IEEE Transactions on Applied Superconductivity. https://doi.org/10.1109/TASC.2026.3664193

MLA:

Smith, Stephen J., et al. "Transition-edge sensor characteristics in a modified bias circuit for multiplexed readout." IEEE Transactions on Applied Superconductivity (2026).

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