Heat Flow Visualization and Thermal Anomaly Detection Using Phase Measuring Deflectometry

Trivedi R, Sharma S, Trivedi V, Sharma R, Groves RM, Sheoran G, Anand A (2025)

Publication Type: Conference contribution

Publication year: 2025

Journal

Proceedings of SPIE Society of Photo-optical Instrumentation Engineers (SPIE)

Publisher: SPIE

Book Volume: 13567

Conference Proceedings Title: Proceedings of SPIE - The International Society for Optical Engineering

Event location: Munich, DEU DE

ISBN: 9781510690424

DOI: 10.1117/12.3066632

Abstract

This study demonstrates Phase Measuring Deflectometry (PMD) as an optical technique for visualizing heat flow and detecting thermal anomalies in metallic materials. Heat conducted from a thermally loaded sample into an adjacent transparent medium induces spatial refractive index gradients, which distort a projected fringe pattern. These distortions are captured and analysed using PMD, enabling emissivity-independent visualization of the heat flow field. Experimental results on aluminium and structural steel slabs reveal distinct phase signatures linked to thermal conductivity differences. The method offers a compact, non-invasive, and surface-independent alternative to conventional thermography, well-suited for engineering diagnostics and material evaluation.

Involved external institutions

Delft University of Technology (TU Delft) NL Netherlands (NL) Sardar Patel University (SPU) IN India (IN) National Institute of Technology Delhi / राष्ट्रीय प्रौद्योगिकी संस्थान दिल्ली IN India (IN)

How to cite

APA:

Trivedi, R., Sharma, S., Trivedi, V., Sharma, R., Groves, R.M., Sheoran, G., & Anand, A. (2025). Heat Flow Visualization and Thermal Anomaly Detection Using Phase Measuring Deflectometry. In Peter Lehmann, Wolfgang Osten, Armando Albertazzi Goncalves (Eds.), Proceedings of SPIE - The International Society for Optical Engineering. Munich, DEU, DE: SPIE.

MLA:

Trivedi, Ragni, et al. "Heat Flow Visualization and Thermal Anomaly Detection Using Phase Measuring Deflectometry." Proceedings of the 14th Optical Measurement Systems for Industrial Inspection, Munich, DEU Ed. Peter Lehmann, Wolfgang Osten, Armando Albertazzi Goncalves, SPIE, 2025.

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