Beuster N, Raschke F, Ihlow A, Andrich C, Del Galdo G (2017)
Publication Type: Conference contribution
Publication year: 2017
Publisher: Institute of Electrical and Electronics Engineers Inc.
Conference Proceedings Title: I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings
Event location: Torino, ITA
ISBN: 9781509035960
DOI: 10.1109/I2MTC.2017.7969907
In this paper, practical investigations of level accuracy and uncertainties using a Rohde & Schwarz signal generator (R&S SMB-B140) and spectrum analyzer (R&S FSV40) are performed up to 30GHz. We show that it is possible to measure frequency responses of DUTs with uncertainties below ±0.05dB up to 30 GHz instead of ±0.5.1.5dB using auto settings, standard setup, or relying on datasheets. The level linearity of instruments with integrated step attenuators is shown to be improved to ±0.03dB instead of ±0.3.1dB by using a special 'hybrid' procedure. Furthermore, it is shown how computer aided measurements procedures should be programmed with these instruments to attain low deviations between measurements.
APA:
Beuster, N., Raschke, F., Ihlow, A., Andrich, C., & Del Galdo, G. (2017). Attaining low uncertainties in measurements with RF signal generators and analyzers. In I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings. Torino, ITA: Institute of Electrical and Electronics Engineers Inc..
MLA:
Beuster, Niklas, et al. "Attaining low uncertainties in measurements with RF signal generators and analyzers." Proceedings of the 2017 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017, Torino, ITA Institute of Electrical and Electronics Engineers Inc., 2017.
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