Integrated Solution for Linear and Non-Linear Single-Touchdown On-Wafer Characterization of D-Band Mixers

Umbach P, Riedmann N, Thome F, Vossiek M, Quay R (2025)


Publication Type: Conference contribution

Publication year: 2025

Journal

Publisher: Institute of Electrical and Electronics Engineers Inc.

Pages Range: 903-906

Conference Proceedings Title: IEEE MTT-S International Microwave Symposium Digest

Event location: San Francisco, CA US

ISBN: 9798331514099

DOI: 10.1109/IMS40360.2025.11103941

Abstract

To pave the way for sub-terahertz communication like sixth-generation wireless technology, this work demonstrates an accurate yet simple D-band measurement setup to evaluate linear and nonlinear distortion characteristics of mixers within a single contact-cycle. The proposed system features a dual-source frequency extender that creates a two-tone signal which can be used for intermodulation and group delay analysis. A comparison to state-of-the-art approaches and on-wafer measurements of a resistive mixer contextualize the system's performance.

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How to cite

APA:

Umbach, P., Riedmann, N., Thome, F., Vossiek, M., & Quay, R. (2025). Integrated Solution for Linear and Non-Linear Single-Touchdown On-Wafer Characterization of D-Band Mixers. In IEEE MTT-S International Microwave Symposium Digest (pp. 903-906). San Francisco, CA, US: Institute of Electrical and Electronics Engineers Inc..

MLA:

Umbach, Patrick, et al. "Integrated Solution for Linear and Non-Linear Single-Touchdown On-Wafer Characterization of D-Band Mixers." Proceedings of the 2025 IEEE/MTT-S International Microwave Symposium, IMS 2025, San Francisco, CA Institute of Electrical and Electronics Engineers Inc., 2025. 903-906.

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