Sepaintner F, Roehrl F, Fischer G, Bogner W, Zorn S (2025)
Publication Language: English
Publication Type: Conference contribution
Publication year: 2025
Publisher: Institute of Electrical and Electronics Engineers Inc.
Pages Range: 411-414
Conference Proceedings Title: 2025 IEEE/MTT-S International Microwave Symposium - IMS 2025
Event location: San Francisco, CA
ISBN: 979-8-3315-1410-5
DOI: 10.1109/IMS40360.2025.11103882
This paper presents a new procedure to characterize frequently utilized transmission lines with conductors having different surfaces with various roughness. Static finite element electromagnetic field calculations are combined with available dynamic formulas for line characterization up to 110 GHz. Simulation results of microstrip lines obtained with this method are compared with results from established simulation software as well as their corresponding measurements. With this easy and fast method, the need for full-wave analysis considering surface roughness of common transmission lines gets obsolete.
APA:
Sepaintner, F., Roehrl, F., Fischer, G., Bogner, W., & Zorn, S. (2025). A Finite Element Method to Model Transmission Lines with Various Rough Conductor Surfaces up to 110 GHz. In 2025 IEEE/MTT-S International Microwave Symposium - IMS 2025 (pp. 411-414). San Francisco, CA, US: Institute of Electrical and Electronics Engineers Inc..
MLA:
Sepaintner, Felix, et al. "A Finite Element Method to Model Transmission Lines with Various Rough Conductor Surfaces up to 110 GHz." Proceedings of the 2025 IEEE/MTT-S International Microwave Symposium, IMS 2025, San Francisco, CA Institute of Electrical and Electronics Engineers Inc., 2025. 411-414.
BibTeX: Download