Englisch S, Wang J, Römling L, Voß J, Wirth J, Mbah Chrameh F, Apeleo Zubiri B, Engel M, Vogel N, Spiecker E (2022)
Publication Language: English
Publication Type: Journal article
Publication year: 2022
Book Volume: 28
Pages Range: 306-309
Issue: S1
DOI: 10.1017/S1431927622002008
In this study, we present a systematic analysis routine for deciphering the crystallographic and defect structure of self-assembled colloidal clusters by nano X-ray microscopy (nano-XRM). The routine uses a multi-axis tilting stage for precise orientation and imaging of colloidal clusters along low-index crystallographic projections. This enables a unique identification of the crystal structure and symmetry of colloidal clusters as well as comprehensive analysis of crystallographic defects, including stacking faults, twin boundaries and lattice dislocations. The nano-XRM investigation of the inner structure of colloidal clusters is correlated with scanning electron microscopy (SEM) of the cluster surface and optical microscopy (OM) of structural color effects. Finally, the formation mechanism of colloidal clusters and their defects is discussed with the help of event-driven molecular dynamics (MD) simulations.
APA:
Englisch, S., Wang, J., Römling, L., Voß, J., Wirth, J., Mbah Chrameh, F.,... Spiecker, E. (2022). Crystal Structure and Defect Analysis of Colloidal Supraparticles by Lab-Based X-ray Microscopy. Microscopy and Microanalysis, 28, 306-309. https://doi.org/10.1017/S1431927622002008
MLA:
Englisch, Silvan, et al. "Crystal Structure and Defect Analysis of Colloidal Supraparticles by Lab-Based X-ray Microscopy." Microscopy and Microanalysis 28 (2022): 306-309.
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