Multi-slice electron ptychographic tomography for three-dimensional phase-contrast microscopy beyond the depth of focus limits
Romanov A, Cho MG, Scott MC, Pelz P (2025)
Publication Type: Journal article
Publication year: 2025
Journal
Book Volume: 8
Article Number: 015005
Journal Issue: 1
Abstract
Electron ptychography is a powerful computational method for atomic-resolution imaging with high contrast for weakly and strongly scattering elements. Modern algorithms coupled with fast and efficient detectors allow imaging specimens with tens of nanometers thicknesses with sub-0.5 Ångstrom lateral resolution. However, the axial resolution in these approaches is currently limited to a few nanometers, limiting their ability to solve novel atomic structures ab initio. Here, we experimentally demonstrate multi-slice ptychographic electron tomography, which allows atomic resolution three-dimensional phase-contrast imaging in a volume surpassing the depth of field limits. We reconstruct tilt-series 4D-STEM measurements of a Co 3 O 4 nanocube, yielding 2 Å axial and 0.7 Å transverse resolution in a reconstructed volume of ( 18.2 nm ) 3 . Our results demonstrate a 13.5-fold improvement in axial resolution compared to multi-slice ptychography while retaining the atomic lateral resolution and the capability to image volumes beyond the depth of field limit. Multi-slice ptychographic electron tomography significantly expands the volume of materials accessible using high-resolution electron microscopy. We discuss further experimental and algorithmic improvements necessary to also resolve single weakly scattering atoms in 3D.
Authors with CRIS profile
Andrey Romanov
Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung)
Philipp Pelz
Professur für Werkstoffwissenschaften (Computational Materials Microscopy)
Involved external institutions
United States (USA) (US)How to cite
APA:
Romanov, A., Cho, M.G., Scott, M.C., & Pelz, P. (2025). Multi-slice electron ptychographic tomography for three-dimensional phase-contrast microscopy beyond the depth of focus limits. JPhys Materials, 8(1). https://doi.org/10.1088/2515-7639/ad9ad2
MLA:
Romanov, Andrey, et al. "Multi-slice electron ptychographic tomography for three-dimensional phase-contrast microscopy beyond the depth of focus limits." JPhys Materials 8.1 (2025).
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