Lukić B, Rack A, Helfen L, Foster DJ, Ershov A, Welß R, François S, Rochet X (2024)
Publication Type: Journal article
Publication year: 2024
Book Volume: 31
Pages Range: 1224-1233
DOI: 10.1107/S1600577524007306
Ultra-high-speed synchrotron-based hard X-ray (i.e. above 10 keV) imaging is gaining a growing interest in a number of scientific domains for tracking non-repeatable dynamic phenomena at spatio-temporal microscales. This work describes an optimized indirect X-ray imaging microscope designed to achieve high performance at micrometre pixel size and megahertz acquisition speed. The entire detector optical arrangement has an improved sensitivity within the near-ultraviolet (NUV) part of the emitted spectrum (i.e. 310-430 nm wavelength). When combined with a single-crystal fast-decay scintillator, such as LYSO:Ce (Lu2-xYxSiO5:Ce), it exploits the potential of the NUV light-emitting scintillators. The indirect arrangement of the detector makes it suitable for high-dose applications that require high-energy illumination. This allows for synchrotron single-bunch hard X-ray imaging to be performed with improved true spatial resolution, as herein exemplified through pulsed wire explosion and superheated near-nozzle gasoline injection experiments at a pixel size of 3.2 μm, acquisition rates up to 1.4 MHz and effective exposure time down to 60 ps.
APA:
Lukić, B., Rack, A., Helfen, L., Foster, D.J., Ershov, A., Welß, R.,... Rochet, X. (2024). Indirect detector for ultra-high-speed X-ray micro-imaging with increased sensitivity to near-ultraviolet scintillator emission. Journal of Synchrotron Radiation, 31, 1224-1233. https://doi.org/10.1107/S1600577524007306
MLA:
Lukić, Bratislav, et al. "Indirect detector for ultra-high-speed X-ray micro-imaging with increased sensitivity to near-ultraviolet scintillator emission." Journal of Synchrotron Radiation 31 (2024): 1224-1233.
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