Spatial resolution improvements with finer-pitch GEMs
Flöthner KJ, Scharenberg L, Brask A, Brunbauer F, Garcia F, Janssens D, Ketzer B, Lisowska M, Muller H, Oliveri E, Orlandini G, Pfeiffer D, Ropelewski L, Samarati J, van Stenis M, Veenhof R (2024)
Publication Type: Journal article
Publication year: 2024
Journal
Book Volume: 19
Article Number: P07027
Journal Issue: 7
DOI: 10.1088/1748-0221/19/07/P07027
Abstract
Gas Electron Multipliers (GEMs) are used in many particle physics experiments, employing their `standard' configuration with amplification holes of 140 μm pitch in a hexagonal pattern. However, the collection of the charge cloud from the primary ionisation electrons from the drift region of the detector into the GEM holes affects the position information from the initial interacting particle. In this paper, the results from studies with a triple-GEM detector with an X-Y-strip readout anode are presented. It is demonstrated that GEMs with a finer hole pitch of here 90 μm improve the detector's spatial resolution. Within these studies, also the impact of the front-end electronics on the spatial resolution was investigated, which is briefly discussed in the paper.
Involved external institutions
Europäische Organisation für Kernforschung (CERN)
Switzerland (CH)
Helsinki Institute of Physics
Finland (FI)
Rheinische Friedrich-Wilhelms-Universität Bonn
Germany (DE)
Switzerland (CH)
Helsinki Institute of Physics
Finland (FI)
Rheinische Friedrich-Wilhelms-Universität Bonn
Germany (DE)
How to cite
APA:
Flöthner, K.J., Scharenberg, L., Brask, A., Brunbauer, F., Garcia, F., Janssens, D.,... Veenhof, R. (2024). Spatial resolution improvements with finer-pitch GEMs. Journal of Instrumentation, 19(7). https://doi.org/10.1088/1748-0221/19/07/P07027
MLA:
Flöthner, K. J., et al. "Spatial resolution improvements with finer-pitch GEMs." Journal of Instrumentation 19.7 (2024).
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