Engelmann A, Scheller K, Probst F, Koch M, Weigel R, Fischer G (2024)
Publication Type: Conference contribution, Conference Contribution
Publication year: 2024
Publisher: IEEE
Event location: Washington, DC
ISBN: 979-8-350
URI: https://ieeexplore.ieee.org/document/10600283
DOI: 10.1109/IMS40175.2024.10600283
This work presents a high-efficiency four-stage D-band power amplifier (PA) in a 22 nm FDSOI technology. The PA incorporates a dynamic biasing scheme that utilizes the SOI transistor's back-gate terminal to optimize the DC power consumption of each stage based on the corresponding input envelope power level. This dynamic bias control significantly improves the linearity and efficiency in the linear and power compression range. The work describes the associated power detectors and the design of a stacked FET output stage used for output power enhancement. Low-k stacked transformers are employed as interstage matching elements to broaden the bandwidth. The PA achieves 24.5 dB gain, covering a 3-dB bandwidth of 36 GHz centered at 138 GHz. Saturated output power and OPldB of 10.8 dBm and 8.6 dBm at nominal supply voltage of 1.6/0.8V is reached while only occupying a core area of 0.045 mm 2 • Achieving 9.6% PAE at OPldB and 3.7% at 6-dB power back-off, the PA demonstrates significant improvement compared to reported D-band PAs in CMOS technology.
APA:
Engelmann, A., Scheller, K., Probst, F., Koch, M., Weigel, R., & Fischer, G. (2024). A Broadband 22 nm FDSOI D-Band Power Amplifier with Dynamic Back Gate Bias Gain-Linearization Achieving 9.6% PAE at 8.7 dBm OPldB and 3.7% at 6 dB Back-off. In Proceedings of the IEEE/MTT-S International Microwave Symposium - IMS 2024. Washington, DC, US: IEEE.
MLA:
Engelmann, Andre, et al. "A Broadband 22 nm FDSOI D-Band Power Amplifier with Dynamic Back Gate Bias Gain-Linearization Achieving 9.6% PAE at 8.7 dBm OPldB and 3.7% at 6 dB Back-off." Proceedings of the IEEE/MTT-S International Microwave Symposium - IMS 2024, Washington, DC IEEE, 2024.
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