An Improved Metric of Informational Masking For Perceptual Audio Quality Measurement

Delgado P, Herre J (2023)

Publication Language: English

Publication Type: Conference contribution, Conference Contribution

Publication year: 2023

Publisher: IEEE

Event location: Mohonk, New Paltz, New York, NY US

Authors with CRIS profile

Pablo Delgado Lehrstuhl für Audiocodierung (AudioLabs) (Stiftungslehrstuhl) Jürgen Herre Lehrstuhl für Audiocodierung (AudioLabs) (Stiftungslehrstuhl)

How to cite

APA:

Delgado, P., & Herre, J. (2023). An Improved Metric of Informational Masking For Perceptual Audio Quality Measurement. In IEEE (Eds.), Proceedings of the IEEE ASSP Workshop on Applications of Signal Processing to Audio and Acoustics. Mohonk, New Paltz, New York, NY, US: IEEE.

MLA:

Delgado, Pablo, and Jürgen Herre. "An Improved Metric of Informational Masking For Perceptual Audio Quality Measurement." Proceedings of the IEEE ASSP Workshop on Applications of Signal Processing to Audio and Acoustics, Mohonk, New Paltz, New York, NY Ed. IEEE, IEEE, 2023.

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