Employing x-ray spectromicroscopy for the understanding of anisotropy in organic thin film growth

Hawly T, Späth A, Johnson M, Streller F, Watts B, Raabe J, Fink R (2023)

Publication Type: Conference contribution

Publication year: 2023

Journal

Publisher: American Institute of Physics Inc.

Book Volume: 2990

Conference Proceedings Title: AIP Conference Proceedings

Event location: Virtual, Online, TWN

DOI: 10.1063/5.0168224

Abstract

We report on the fabrication of high-quality organic semiconducting thin films from the potent benchmark molecular compounds pentacene and C8-BTBT-C8. For organic films prepared by the floating-lens method, we observe 1D anisotropy in linear NEXAFS dichroism. Based on the molecular orientation contrast in scanning transmission x-ray microspectroscopy (STXM), azimuthal sample rotation and AFM, we can confirm a high degree of long-range molecular order. The experimental results allow for deeper insight into the presumed growth behavior, which appears to crucially depend on the nature, or more specifically, the aromaticity and volatility, of the used solvent.

Authors with CRIS profile

Involved external institutions

Paul Scherrer Institute (PSI) Switzerland (CH)

How to cite

APA:

Hawly, T., Späth, A., Johnson, M., Streller, F., Watts, B., Raabe, J., & Fink, R. (2023). Employing x-ray spectromicroscopy for the understanding of anisotropy in organic thin film growth. In Tzu-Hung Chuang, Bi-Hsuan Lin, Hung-Wei Shiu, Der-Hsin Wei (Eds.), AIP Conference Proceedings. Virtual, Online, TWN: American Institute of Physics Inc..

MLA:

Hawly, Tim, et al. "Employing x-ray spectromicroscopy for the understanding of anisotropy in organic thin film growth." Proceedings of the 15th International Conference on X-ray Microscopy, XRM 2022, Virtual, Online, TWN Ed. Tzu-Hung Chuang, Bi-Hsuan Lin, Hung-Wei Shiu, Der-Hsin Wei, American Institute of Physics Inc., 2023.

BibTeX: Download