Masking for DDG in SPECT Reduces Influence of Motion Artifacts

Reymann M, Vija AH, Maier A (2023)

Publication Language: English

Publication Type: Conference contribution

Publication year: 2023

Publisher: IEEE

Conference Proceedings Title: IEEE RTSD NSS-MIC 2023

Authors with CRIS profile

Maximilian Reymann Lehrstuhl für Informatik 5 (Mustererkennung) Andreas Maier Lehrstuhl für Informatik 5 (Mustererkennung)

Involved external institutions

Siemens AG, Healthcare Sector DE Germany (DE)

How to cite

APA:

Reymann, M., Vija, A.H., & Maier, A. (2023). Masking for DDG in SPECT Reduces Influence of Motion Artifacts. In IEEE (Eds.), IEEE RTSD NSS-MIC 2023. IEEE.

MLA:

Reymann, Maximilian, A. Hans Vija, and Andreas Maier. "Masking for DDG in SPECT Reduces Influence of Motion Artifacts." Proceedings of the IEEE RTSD NSS-MIC 2023 Ed. IEEE, IEEE, 2023.

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