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Understanding the Reduction Behavior of VOx/CeO2 on a Molecular Level: Combining Temperature-Programmed Reduction with Multiple In-Situ Spectroscopies and X-ray Diffraction

Schumacher L, Ziemba M, Brunnengräber K, Totzauer L, Hofmann K, Etzold BJ, Albert B, Hess C (2023)

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Publication Type: Journal article

Publication year: 2023

Journal

Book Volume: 127

Pages Range: 5810-5824

Journal Issue: 12

DOI: 10.1021/acs.jpcc.3c00622

Abstract

As catalytic processes become more important in academic and industrial applications, an intimate understanding is highly desirable to improve their efficiency on a rational basis. Because thorough mechanistic investigations require an elaborate and expensive spectroscopic and theoretical analysis, it is a major goal to link mechanistic insights to simple descriptors, such as the reducibility, that are accessible by temperature-programmed reduction (TPR) experiments, to bridge the gap between fundamental understanding and application of catalysts. In this work, we present a detailed in-situ spectroscopic analysis of TPR results from loading-dependent VOx/CeO2 catalysts, using in-situ multiwavelength Raman, IR, UV-vis, and quasi-in-situ X-ray photoelectron spectroscopy as well as in-situ X-ray diffraction. The catalyst reduction shows a complex network of different processes, contributing to the overall reducibility, which are controlled by the unique interaction at the vanadia-ceria interface. The temperatures at which they occur depend significantly on the nuclearity of the surface vanadia species. By elucidating the temperature- and vanadia loading-dependent behavior, we provide a fundamental understanding of the underlying molecular processes, thus developing an important basis for interpretation of the reduction behavior of other oxide catalysts.

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How to cite

APA:

Schumacher, L., Ziemba, M., Brunnengräber, K., Totzauer, L., Hofmann, K., Etzold, B.J.,... Hess, C. (2023). Understanding the Reduction Behavior of VOx/CeO2 on a Molecular Level: Combining Temperature-Programmed Reduction with Multiple In-Situ Spectroscopies and X-ray Diffraction. Journal of Physical Chemistry C, 127(12), 5810-5824. https://dx.doi.org/10.1021/acs.jpcc.3c00622

MLA:

Schumacher, Leon, et al. "Understanding the Reduction Behavior of VOx/CeO2 on a Molecular Level: Combining Temperature-Programmed Reduction with Multiple In-Situ Spectroscopies and X-ray Diffraction." Journal of Physical Chemistry C 127.12 (2023): 5810-5824.

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