Highly Localized Optical Field Enhancement at Neon Ion Sputtered Tungsten Nanotips

Paschen T, Brückner L, Wu M, Spiecker E, Hommelhoff P (2023)


Publication Type: Journal article

Publication year: 2023

Journal

Original Authors: Timo Paschen, Leon Brückner, Mingjian Wu, Erdmann Spiecker, Peter Hommelhoff

DOI: 10.1021/acs.nanolett.3c01985

Abstract

We present laser-driven rescattering of electrons at a nanometric protrusion (nanotip), which is fabricated with an in situ neon ion sputtering technique applied to a tungsten needle tip. Electron energy spectra obtained before and after the sputtering show rescattering features, such as a plateau and high-energy cutoff. Extracting the optical near-field enhancement in both cases, we observe a strong increase of more than 2-fold for the nanotip. Accompanying finite-difference time-domain (FDTD) simulations show a good match with the experimentally extracted near-field strengths. Additionally, high electric field localization for the nanotip is found. The combination of transmission electron microscope imaging of such nanotips and the determination of the near-field enhancement by electron rescattering represent a full characterization of the electric near-field of these intriguing electron emitters. Ultimately, nanotips as small as single nanometers can be produced, which is of utmost interest for electron diffraction experiments and low-emittance electron sources.

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APA:

Paschen, T., Brückner, L., Wu, M., Spiecker, E., & Hommelhoff, P. (2023). Highly Localized Optical Field Enhancement at Neon Ion Sputtered Tungsten Nanotips. Nano Letters. https://dx.doi.org/10.1021/acs.nanolett.3c01985

MLA:

Paschen, Timo, et al. "Highly Localized Optical Field Enhancement at Neon Ion Sputtered Tungsten Nanotips." Nano Letters (2023).

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