On the Optical Properties of Thin-Film Vanadium Dioxide from the Visible to the Far Infrared

Wan C, Zhang Z, Woolf D, Hessel CM, Rensberg J, Hensley JM, Xiao Y, Shahsafi A, Salman J, Richter S, Sun Y, Qazilbash MM, Schmidt-Grund R, Ronning C, Ramanathan S, Kats MA (2019)

Publication Type: Journal article

Publication year: 2019

Journal

Annalen Der Physik Wiley-VCH Verlag

Book Volume: 531

Article Number: 1900188

Journal Issue: 10

DOI: 10.1002/andp.201900188

Abstract

The insulator-to-metal transition (IMT) in vanadium dioxide (VO2) can enable a variety of optics applications, including switching and modulation, optical limiting, and tuning of optical resonators. Despite the widespread interest in VO2 for optics, the wavelength-dependent optical properties across its IMT are scattered throughout the literature, are sometimes contradictory, and are not available at all in some wavelength regions. Here, the complex refractive index of VO2 thin films across the IMT is characterized for free-space wavelengths from 300 nm to 30 µm, using broadband spectroscopic ellipsometry, reflection spectroscopy, and the application of effective-medium theory. VO2 films of different thicknesses are studied, on two different substrates (silicon and sapphire), and grown using different synthesis methods (sputtering and sol–gel). While there are differences in the optical properties of VO2 synthesized under different conditions, these differences are surprisingly small in the ≈2–11 µm range where the insulating phase of VO2 also has relatively low optical loss. It is anticipated that the refractive-index datasets from this article will be broadly useful for modeling and design of VO2-based optical and optoelectronic components, especially in the mid-wave and long-wave infrared.

Involved external institutions

University of Wisconsin - Madison US United States (USA) (US) Purdue-University US United States (USA) (US) Physical Sciences Inc.(PSI) US United States (USA) (US) Friedrich-Schiller-Universität Jena DE Germany (DE) Universität Leipzig DE Germany (DE) College of William & Mary US United States (USA) (US)

How to cite

APA:

Wan, C., Zhang, Z., Woolf, D., Hessel, C.M., Rensberg, J., Hensley, J.M.,... Kats, M.A. (2019). On the Optical Properties of Thin-Film Vanadium Dioxide from the Visible to the Far Infrared. Annalen Der Physik, 531(10). https://dx.doi.org/10.1002/andp.201900188

MLA:

Wan, Chenghao, et al. "On the Optical Properties of Thin-Film Vanadium Dioxide from the Visible to the Far Infrared." Annalen Der Physik 531.10 (2019).

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