Determining the waveguide profile using the overlap integral
Alberucci A, Jisha CP, Nolte S (2019)
Publication Type: Conference contribution
Publication year: 2019
Publisher: Institute of Electrical and Electronics Engineers Inc.
Conference Proceedings Title: 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019
Event location: Munich, DEU
ISBN: 9781728104690
DOI: 10.1109/CLEOE-EQEC.2019.8872199
Abstract
The determination of the index profile in guiding structures is a central problem in applied photonics, ranging from optical fibers to femtosecond-written waveguides [1]. A non-destructive and relatively easy method consists in the measurement of the index profile by measuring the transmitted field [2]. From the transmitted field, the refractive index profile is computed by direct inversion of the Helmholtz equation. This technique is called near-field method. Here we present a new near-field method based upon the inversion of the overlap integral.
Involved external institutions
Germany (DE)How to cite
APA:
Alberucci, A., Jisha, C.P., & Nolte, S. (2019). Determining the waveguide profile using the overlap integral. In 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019. Munich, DEU: Institute of Electrical and Electronics Engineers Inc..
MLA:
Alberucci, Alessandro, Chandroth P. Jisha, and Stefan Nolte. "Determining the waveguide profile using the overlap integral." Proceedings of the 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019, Munich, DEU Institute of Electrical and Electronics Engineers Inc., 2019.
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