Determination of the full deformation tensor by multi-Bragg fast scanning nano X-ray diffraction Determination of the full deformation tensor

Johannes A, Rensberg J, Grunewald TA, Schoppe P, Ritzer M, Rosenthal M, Ronning C, Burghammer M (2020)

Publication Type: Journal article

Publication year: 2020

Journal

Journal of Applied Crystallography International Union of Crystallography

Book Volume: 53

Pages Range: 99-106

DOI: 10.1107/S1600576719016534

Abstract

This work showcases a method to map the full deformation tensor in a single micro-sized crystal. It is shown that measuring the position of two Bragg reflections in reciprocal space is sufficient to obtain the full deformation tensor, if the condition of incompressibility of the material is imposed. This method is used to reveal the surface tension induced deformation at the edges of an as-grown single-crystal VO2 microwire. All components of the deformation tensor of the microwire were measured down to an absolute value of 10^-4 in an 8 × 14 µm projected area of the wire. With a beam-defined spatial resolution of 150 × 150 nm, the measurement time was merely 2.5 h.

Involved external institutions

European Synchrotron Radiation Facility (ESRF)

France (FR) Friedrich-Schiller-Universität Jena

Germany (DE)

How to cite

APA:

Johannes, A., Rensberg, J., Grunewald, T.A., Schoppe, P., Ritzer, M., Rosenthal, M.,... Burghammer, M. (2020). Determination of the full deformation tensor by multi-Bragg fast scanning nano X-ray diffraction Determination of the full deformation tensor. Journal of Applied Crystallography, 53, 99-106. https://doi.org/10.1107/S1600576719016534

MLA:

Johannes, Andreas, et al. "Determination of the full deformation tensor by multi-Bragg fast scanning nano X-ray diffraction Determination of the full deformation tensor." Journal of Applied Crystallography 53 (2020): 99-106.

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