Scanning high-sensitive X-ray polarization microscopy

Marx-Glowna B, Grabiger B, Loetzsch R, Uschmann , Schmitt AT, Schulze KS, Last A, Roth T, Antipov S, Schlenvoigt HP, Sergueev , Leupold O, Roehlsberger R, Paulus GG (2022)

Publication Type: Journal article

Publication year: 2022

Journal

New Journal of Physics Institute of Physics: Open Access Journals / Institute of Physics (IoP) and Deutsche Physikalische Gesellschaft

Book Volume: 24

Article Number: 053051

Journal Issue: 5

DOI: 10.1088/1367-2630/ac6e80

Abstract

We report on the realization of an extremely sensitive X-ray polarization microscope, allowing to detect tiniest polarization changes of 1 in 100 billion (10-11) with a μm-size focused beam. The extreme degree of polarization purity places the most stringent requirements on the orientation of the polarizer and analyzer crystals as well as the composition and the form fidelity of the lenses, which must not exhibit any birefringence. The results show that these requirements are currently only met by polymer lenses. Highly sensitive scanning X-ray polarization microscopy thus is established as a new method. It can provide new insights in a wide range of applications ranging from quantum electrodynamics and quantum optics to X-ray spectroscopy, materials research, and laser physics.

Involved external institutions

Helmholtz-Institut Jena (HI-Jena) / Helmholtz Institute Jena DE Germany (DE) Friedrich-Schiller-Universität Jena DE Germany (DE) Karlsruhe Institute of Technology (KIT) DE Germany (DE) European Synchrotron Radiation Facility (ESRF) FR France (FR) Euclid TechLabs LLC US United States (USA) (US) Helmholtz-Zentrum Dresden-Rossendorf (HZDR) DE Germany (DE) Deutsches Elektronen-Synchrotron DESY DE Germany (DE)

How to cite

APA:

Marx-Glowna, B., Grabiger, B., Loetzsch, R., Uschmann, ., Schmitt, A.T., Schulze, K.S.,... Paulus, G.G. (2022). Scanning high-sensitive X-ray polarization microscopy. New Journal of Physics, 24(5). https://dx.doi.org/10.1088/1367-2630/ac6e80

MLA:

Marx-Glowna, B., et al. "Scanning high-sensitive X-ray polarization microscopy." New Journal of Physics 24.5 (2022).

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